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First-principles study of thin magnetic transition-metal silicide films on Si(001)

机译:薄磁过渡金属硅化物薄膜的第一性原理研究   在si(001)

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摘要

In order to combine silicon technology with the functionality of magneticsystems, a number of ferromagnetic (FM) materials have been suggested for thefabrication of metal/semiconductor heterojunctions. In this work, we present asystematic study of several candidate materials in contact with the Si surface.We employ density-functional theory calculations to address the thermodynamicstability and magnetism of both pseudomorphic CsCl-like $M$Si ($M$=Mn, Fe, Co,Ni) thin films and Heusler alloy $M_2$MnSi ($M$=Fe, Co, Ni) films on Si(001).Our calculations show that Si-termination of the $M$Si films is energeticallypreferable during epitaxy since it minimizes the energetic cost of broken bondsat the surface. Moreover, we can explain the calculated trends in thermodynamicstability of the $M$Si thin films in terms of the $M$-Si bond-strength and the$M$ 3d orbital occupation. From our calculations, we predict that ultrathinMnSi films are FM with sizable spin magnetic moments at the Mn atoms, whileFeSi and NiSi films are nonmagnetic. However, CoSi films display itinerantferromagnetism. For the $M_2$MnSi films with Heusler-type structure, the MnSitermination is found to have the highest thermodynamic stability. In the FMground state, the calculated strength of the effective coupling between themagnetic moments of Mn atoms within the same layer approximately scales withthe measured Curie temperatures of the bulk $M_2$MnSi compounds. In particular,the Co$_2$MnSi/Si(001) thin film has a robust FM ground state as in the bulk,and is found to be stable against a phase separation into CoSi/Si(001) andMnSi/Si(001) films. Hence this material is of possible use in FM-Siheterojunctions and deserves further experimental investigations.
机译:为了将硅技术与磁系统的功能相结合,已经提出了许多用于制造金属/半导体异质结的铁磁(FM)材料。在这项工作中,我们对与Si表面接触的几种候选材料进行了系统研究,我们使用密度泛函理论计算来解决两种类似CsCl的$ M $ Si($ M $ = Mn,Fe Si(001)上的,Co,Ni)薄膜和Heusler合金$ M_2 $ MnSi($ M $ = Fe,Co,Ni)薄膜。我们的计算表明,在外延期间,$ M $ Si薄膜的硅端接在能量上更可取因为它最大程度地减少了表面断裂键的能源成本。此外,我们可以从$ M $ -Si键强度和$ M $ 3d轨道占据的角度来解释$ M $ Si薄膜的热力学稳定性的计算趋势。根据我们的计算,我们预测超薄MnSi薄膜是FM,在Mn原子处有相当大的自旋磁矩,而FeSi和NiSi薄膜则是非磁性的。但是,CoSi膜会显示出铁磁性。对于具有Heusler型结构的$ M_2 $ MnSi薄膜,发现MnSitermination具有最高的热力学稳定性。在FMground状态下,计算出的同一层内Mn原子的磁矩之间的有效耦合强度大约与块状$ M_2 $ MnSi化合物的居里温度成比例。尤其是,Co $ _2 $ MnSi / Si(001)薄膜具有坚固的FM基态,并且对于相分离成CoSi / Si(001)和MnSi / Si(001)稳定。电影。因此,该材料可能在FM-异质结中使用,值得进一步的实验研究。

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